test probe信息详情
[试验]测试探针;测试探头
probe───n.(Probe)人名;(法)普罗布;vi.调查;探测;n.探针;调查;vt.探查;用探针探测
sample probe───试样探针;取样探头
adequately probe───充分探测
temperature probe───温度传感器;n.温度探针
probe for───探索
lunar probe───[航]月球探测器
genex probe───genex探针
probe tips───探针针尖
probe cover───探头盖
present invention is directed to a test probe having an indexable probe tip.───发明涉及具有可标引的探针针尖的测试探针。
The utility model relates to a semiconductor test device, in particular to a semiconductor test probe.───本实用新型涉及一种半导体测试器件,尤其是半导体测试探针。
shall not be possible to touch live parts with the test probe.───试验探棒应不能触及到带电部件。
If the thruster being tested is not fixed on the test stand and only ejects towards a test probe, then the above problem can be avoided.───如果不将推进器安装在测试台架上,而只对准探头喷射,进行间接测力,则可避免引线干扰的问题。
The invisible short circuit fault paths could sometimes be eliminated by running a test probe between the affected fine pitch leads.───不可见的短路有时会因有测针在引脚间划过而消失
Wafer-level IC test probe card is mainly used in the test of chips electric characters before packaging.───集成电路圆片级测试探卡主要应用于分片封装前对芯片电学性能进行初测。
Aerospace series - Elements of electrical and optical connection - Test methods - Part 6415 : optical elements - Test probe damage.───航空航天系列.电气及光学连接件.试验方法.第6415部分:光学件.检测探针损伤
Aerospace series - Elements of electrical and optical connection - Test methods - Part 415 : test probe damage (female contacts).───航空航天系列.电气及光学连接件.试验方法.第415部分:检测探针损伤(塞孔接点)
- twist setting chamber
- the most important thing to me
- support program
- what the future holds
- thinking out loudsolo
- test problem
- unwelcome guest
- wire fraud
- springtime in my heart
- yin wei
- view files
- water right
- yin wei hua
- what the future will be like
- wire gauge
- water right value
- thinking out of the box
- what the game interesting
- support ratio
- test procedures
- wire gauge sizes